Advertisement No: | #00146261 |
Category: | Profiler Measurement Device |
Product Type: | For Sale |
Product Status: | New |
Mikroskop Tabanlı Sistem Polytec TMS-1200 TopMap µ.Lab Nanometre Çözünürlüklü Mikroskop Sistemi TMS-1200 TopMap µ.Lab ile mikroyapıların yüzeylerini çok yüksek yatay çözünürlükle karakterize edebilirsiniz. Optik profilometre hassas ve hassas yapılı dokularda, düzlemsellik, dalgalanma ve pürüzlülük gibi parametreleri temassız olarak belirler. Polytec akıllı yüzey tarama teknolojisi, farklı yansıtma özelliklerine sahip yüzey alanlarını da ölçebilmektedir. İsteğe bağlı olarak, motorize şaryo ile X-Y ekseninde görüntüler birleştirilir (Stitching).
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